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AD5611BKS Folha de dados(PDF) 8 Page - Analog Devices

Nome de Peças AD5611BKS
Descrição Electrónicos  2.7 V to 5.5 V, <100 UA, 8-/10-/12-Bit nanoDAC D/A, SPI Interface, SC70 Package
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Fabricante Electrônico  AD [Analog Devices]
Página de início  http://www.analog.com
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AD5611BKS Folha de dados(HTML) 8 Page - Analog Devices

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AD5601/AD5611/AD5621
Preliminary Technical Data
Rev. PrC | Page 8 of 20
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical INL versus code plot can be seen in Figure 4.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL versus code plot can be
seen in Figure 7.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5601/AD5611/AD5621, because the output of the DAC
cannot go below 0 V. Zero-code error is due to a combination of
the offset errors in the DAC and output amplifier. Zero-code
error is expressed in mV. A plot of zero-code error versus
temperature can be seen in Figure 6.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be VDD − 1 LSB. Full-scale error is expressed in percent
of full-scale range. A plot of full-scale error versus temperature
can be seen in Figure 6.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal,
expressed as a percent of the full-scale range.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error
taking all the various errors into account. A typical TUE versus
code plot can be seen in Figure 5.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in µV/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in (ppm of full-scale
range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000). See
Figure 17.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It is
specified in nV-s and is measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.


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