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GRM21A7U2D821JW31 Folha de dados(PDF) 3 Page - Murata Manufacturing Co., Ltd. |
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GRM21A7U2D821JW31 Folha de dados(HTML) 3 Page - Murata Manufacturing Co., Ltd. |
3 / 28 page No 11 Adhesive Strength No removal of the terminations or other defect Solder the capacitor on the test substrate A shown in "Complement of Test of Termination should occur. method”. Applied Direction : In parallel with the test substrate and vertical with the capacitor side. 12 Substrate Appearance No defects or abnormalities. Solder the capacitor on the test substrate B shown in "Complement of Test Bending test method”. Then apply the force in the direction shown in “Test Method of Substrate Capacitance Within +/-2% or +/-0.3pF (Whichever is larger) Bending test” of “Complement of Test method”. Change Flexure : 1mm Holding Time : 5+/-1s Soldering Method : Reflow soldering 13 Temperature Appearance No defects or abnormalities. Fix the capacitor to the supporting Test substrate A (glass epoxy board) Sudden Change shown in “Complement of Test method”. Perform the 5 cycles according to the four heat treatments Capacitance Within +/-2% or +/-0.3pF (Whichever is larger) shown in the following table. Change Q 500 min. I.R. Within the specified initial value. Exposure Time : 24+/-2h at room condition*. Voltage proof No defects. 14 Humidity Appearance No defects or abnormalities. Fix the capacitor to the supporting Test substrate A (glass epoxy board) (Steady state) shown in “Complement of Test method”. Capacitance Within +/-2% or +/-0.3pF (Whichever is larger) Test Temperature : 40+/-2℃ Change Test Humidity : 90% to 95%RH Test Time : 500+24/-0h Q 350 min. Exposure Time : 24+/-2h at room condition*. I.R. More than 1000MΩ or 10MΩ・μF (Whichever is smaller) Voltage proof No defects. 15 Durability Appearance No defects or abnormalities. Fix the capacitor to the supporting Test substrate A (glass epoxy board) shown in “Complement of Test method”. Test Temperature : Max. Operating Temp. +/-3℃ Capacitance Within +/-2% or +/-0.3pF (Whichever is larger) Test Time : 1000+48/-0h Change Applied Voltage : 150% of the rated voltage (Rated voltage:DC200V,DC250V) 120% of the rated voltage Q 350 min. (Rated voltage:DC500V,DC630V,DC1kV,DC2kV) (Rated voltage(7U only):DC3.15kV) I.R. More than 1000MΩ or 10MΩ・μF Charge/discharge current : 50mA max. (Whichever is smaller) Exposure Time : 24+/-2h at room condition*. Voltage proof No defects. *Room Condition : Temperature:15 to 35°C, Relative humidity:45 to 75%, Atmosphere pressure:86 to 106kPa Item Specification Test Method (Ref. Standard:JIS C 5101, IEC60384) 10N, 10+/-1s Step Temp.( C) Time (min) 1 Min.Operating Temp.+0/-3 30+/-3 2 Room Temp 2 to 3 3 Max.Operating Temp.+3/-0 30+/-3 4 Room Temp 2 to 3 JEMCGS-04233D 3 |
Nº de peça semelhante - GRM21A7U2D821JW31 |
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Descrição semelhante - GRM21A7U2D821JW31 |
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