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LM124AWLQMLV Folha de dados(PDF) 5 Page - National Semiconductor (TI) |
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LM124AWLQMLV Folha de dados(HTML) 5 Page - National Semiconductor (TI) |
5 / 27 page Quality Conformance Inspection MIL-STD-883, Method 5005 — Group A Subgroup Description Temp ( ˚C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 www.national.com 5 |
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