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74LVC16241A Folha de dados(PDF) 4 Page - NXP Semiconductors

Nome de Peças 74LVC16241A
Descrição Electrónicos  16-bit buffer/line driver 3-State
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Fabricante Electrônico  PHILIPS [NXP Semiconductors]
Página de início  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LVC16241A Folha de dados(HTML) 4 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74LVC16241A
16-bit buffer/line driver (3-State)
1997 Jul 29
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
MIN.
MAX.
VCC
DC supply voltage (for max. speed
performance)
2.7
3.6
V
VCC
DC supply voltage (for low-voltage
applications)
1.2
3.6
V
VI
DC Input voltage range
0
5.5
V
VO
DC output voltage range; output HIGH or
LOW state
0
VCC
V
VO
DC output voltage range; output 3-State
0
5.5
V
Tamb
Operating ambient temperature range in
free air
See DC and AC characteristics
for individual device
–40
+85
°C
tr, tf
Input rise and fall times
VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134) Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
VCC
DC supply voltage
–0.5
+6.5
V
IIK
DC input diode current
VI < 0
–50
mA
VI
DC input voltage
Note 2
–0.5
+6.5
V
IOK
DC output diode current
VO > VCC or VO < 0
"50
mA
VO
DC output voltage; output HIGH or LOW
state
Note 2
–0.5
VCC + 0.5
V
VO
DC output voltage; output 3-State
Note 2
–0.5
6.5
V
IO
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC
DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–65
+150
°C
Power dissipation per package
Ptot
– SO package
Above +70
°C derate linearly 8mW/K
500
mW
– SSOP and TSSOP package
Above +60
°C derate linearly 5.5mW/K
500
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output clamp current ratings are observed.


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