Os motores de busca de Datasheet de Componentes eletrônicos
  Portuguese  ▼
ALLDATASHEETPT.COM

X  

SN74ABT8245DWRE4 Folha de dados(PDF) 5 Page - Texas Instruments

Nome de Peças SN74ABT8245DWRE4
Descrição Electrónicos  SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
Download  28 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrônico  TI [Texas Instruments]
Página de início  http://www.ti.com
Logo TI - Texas Instruments

SN74ABT8245DWRE4 Folha de dados(HTML) 5 Page - Texas Instruments

  SN74ABT8245DWRE4 Datasheet HTML 1Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 2Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 3Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 4Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 5Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 6Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 7Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 8Page - Texas Instruments SN74ABT8245DWRE4 Datasheet HTML 9Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 5 / 28 page
background image
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
test architecture
Serial-test information is conveyed by means of a 4-wire test bus or TAP that conforms to IEEE Standard
1149.1-1990. Test instructions, test data, and test control signals all are passed along this serial-test bus. The
TAP controller monitors two signals from the test bus, TCK and TMS. The TAP controller extracts the
synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip
control signals for the test structures in the device. Figure 1 shows the TAP-controller state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and
output data changes on the falling edge of TCK. This scheme ensures data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram shows the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship among the test bus, the TAP controller, and the test registers. As illustrated,
the device contains an 8-bit instruction register and three test-data registers: a 36-bit boundary-scan register,
an 11-bit boundary-control register, and a 1-bit bypass register.
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
Figure 1. TAP-Controller State Diagram


Nº de peça semelhante - SN74ABT8245DWRE4

Fabricante ElectrônicoNome de PeçasFolha de dadosDescrição Electrónicos
logo
Texas Instruments
SN74ABT8245DWRE4 TI-SN74ABT8245DWRE4 Datasheet
635Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
More results

Descrição semelhante - SN74ABT8245DWRE4

Fabricante ElectrônicoNome de PeçasFolha de dadosDescrição Electrónicos
logo
Texas Instruments
SN54ABT8245 TI-SN54ABT8245_07 Datasheet
635Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A TI-SN54BCT8245A Datasheet
309Kb / 22P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A TI-SN54BCT8245A_08 Datasheet
658Kb / 29P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_08 Datasheet
665Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245 Datasheet
364Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8952 TI-SN54ABT8952_07 Datasheet
529Kb / 29P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952 TI-SN54ABT8952 Datasheet
365Kb / 24P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8543 TI-SN54ABT8543 Datasheet
357Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8543 TI1-SN54ABT8543_15 Datasheet
537Kb / 31P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8646 TI-SN54ABT8646 Datasheet
537Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28


Folha de dados Download

Go To PDF Page


Ligação URL




Privacy Policy
ALLDATASHEETPT.COM
ALLDATASHEET é útil para você?  [ DONATE ] 

Sobre Alldatasheet   |   Publicidade   |   Contato conosco   |   Privacy Policy   |   roca de Link   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com