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MC100E241 Folha de dados(PDF) 4 Page - ON Semiconductor

Nome de Peças MC100E241
Descrição Electrónicos  5V ECL 8-Bit Scannable Register
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Fabricante Electrônico  ONSEMI [ON Semiconductor]
Página de início  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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MC100E241
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4
Table 6. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 5)
Symbol
Characteristic
0°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
fMAX
Maximum Toggle Frequency
900
900
900
GHz
fSHIFT
Max. Shift Frequency
700
900
700
900
700
900
MHz
tPLH
Propagation Delay to Output
ps
tPHL
CLK
625
750
975
625
750
975
625
750
975
MR
600
725
975
600
725
975
600
725
975
ts
Setup Time
ps
D
175
25
175
25
175
25
SEL0 (SHIFT)
350
200
350
200
350
200
SEL1 (HOLD/LOAD)
400
250
400
250
400
250
S-IN
125
−100
125
−100
125
−100
th
Hold Time
ps
D
200
−25
200
−25
200
−25
SEL0 (SHIFT)
100
−200
100
−200
100
−200
SEL1 (HOLD/LOAD)
50
−250
50
−250
50
−250
S-IN
300
100
300
100
300
100
tRR
Reset Recovery Time
900
600
900
600
900
600
ps
tPW
Minimum Pulse Width
ps
CLK, MR
400
400
400
tSKEW
Within-Device Skew (Note 6)
60
60
60
ps
tJITTER
Random Clock Jitter (RMS)
< 1
< 1
< 1
ps
tr
Rise/Fall Times
ps
tf
(20 - 80%)
300
525
800
300
525
800
300
525
800
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
5. 100 Series: VEE can vary −0.46 V / +0.8 V.
6. Within-device skew is defined as identical transitions on similar paths through a device.


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