MC10141

http://onsemi.com

4

TEST VOLTAGE VALUES (Volts)

@ Test Temperature

–30

°C

–0.890

–1.890

–1.205

–1.500

–5.2

+25

°C

–0.810

–1.850

–1.105

–1.475

–5.2

+85

°C

–0.700

–1.825

–1.035

–1.440

–5.2

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

(V

)

Characteristic

Symbol

Under

Test

P1

P2

P3

Gnd

Power Supply Drain Current

8

8

1, 16

Input Current

5

6

7

4

5

6

7

4

8

8

8

8

1, 16

1, 16

1, 16

1, 16

12

4,5,6,7,9,

10,11,13

12

8

1, 16

Output Voltage

Logic 1

3

6

8

4

1, 16

Output Voltage

Logic 0

3

8

4

1, 16

Threshold Voltage

Logic 1

(Note 1.)

3

3

3

3

6

6

Note 3.

Note 3.

6

7

8

8

8

8

4

4

4

4

1, 16

1, 16

1, 16

1, 16

Threshold Voltage

Logic 0

(Note 1.)

3

3

3

3

6

Note 4.

Note 4.

6

7

8

8

8

8

4

4

4

4

1, 16

1, 16

1, 16

1, 16

Switching Times (50

Ω Load)

–3.2 V

+2.0 V

Propagation Delay

3

14

14

14

8

8

8

8

1, 16

1, 16

1, 16

1, 16

Rise Time

(20 to 80%)

3

8

1, 16

Fall Time

(20 to 80%)

3

8

1, 16

Shift Frequency

Note 2.

8

1, 16

1. These tests to be performed in sequence as shown.

P1

P2

P3

2. See shift frequency test circuit for test procedures.

3. Reset to zero before performing test.

4. Reset to one before performing test.

Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been

established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.

Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the

same manner.