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MC14016BCP Folha de dados(PDF) 6 Page - ON Semiconductor |
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MC14016BCP Folha de dados(HTML) 6 Page - ON Semiconductor |
6 / 11 page MC14016B http://onsemi.com 6 Figure 6. RON Characteristics Test Circuit Figure 7. Propagation Delay Test Circuit and Waveforms VC Vin Vout RL Vout Vin RL CL 20 ns 20 ns VDD VSS Vin Vout tPLH tPHL 50% 10% 50% 90% Figure 8. Turn−On Delay Time Test Circuit and Waveforms Figure 9. Crosstalk Test Circuit VC Vout Vin RL CL VX 20 ns VC Vout Vout 10% 90% 10% 90% 90% 50% 10% tPZH tPHZ VDD VSS tPLZ tPZL Vin = VDD Vx = VSS Vin = VSS Vx = VDD VC Vout Vin 1 k 10 k 15 pF Figure 10. Noise Voltage Test Circuit Figure 11. Typical Noise Characteristics VC = VDD OUT IN QUAN−TECH MODEL 2283 OR EQUIV 100 k 10 k 1.0k 100 10 35 30 25 20 0 10 Vdc 5.0 Vdc f, FREQUENCY (Hz) 15 10 5.0 VDD = 15 Vdc |
Nº de peça semelhante - MC14016BCP |
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Descrição semelhante - MC14016BCP |
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