MC100EL1648

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3

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

Power Supply PECL Mode

7 to 0

V

Power Supply NECL Mode

−7 to 0

V

PECL Mode Input Voltage

NECL Mode Input Voltage

6 to 0

−6 to 0

V

V

Output Current

Continuous

Surge

50

100

mA

mA

Operating Temperature Range

−40 to +85

°C

Storage Temperature Range

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

SOIC−8

SOIC−8

190

130

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

SOIC−8

41 to 44

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

TSSOP−8

TSSOP−8

185

140

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

TSSOP−8

41 to 44

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

SOIC−14

SOIC−14

150

110

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

SOIC−14

41 to 44

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

DFN8

DFN8

129

84

°C/W

°C/W

Wave Solder

Pb

Pb−Free

<2 to 3 sec @ 248

°C

<2 to 3 sec @ 260

°C

265

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.