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AD5421 Folha de dados(PDF) 7 Page - Analog Devices

Nome de Peças AD5421
Descrição Electrónicos  16-Bit, Serial Input, Loop-Powered, 4 mA to 20 mA DAC
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Fabricante Electrônico  AD [Analog Devices]
Página de início  http://www.analog.com
Logo AD - Analog Devices

AD5421 Folha de dados(HTML) 7 Page - Analog Devices

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AD5421
Rev. 0 | Page 7 of 32
AC PERFORMANCE CHARACTERISTICS
Loop voltage = 24 V; REFIN = 2.5 V external; RL = 250 Ω; all specifications TMIN to TMAX, unless otherwise noted.
Table 3.
Parameter1
Min
Typ
Max
Unit
Test Conditions/Comments
DYNAMIC PERFORMANCE
Loop Current Settling Time
50
μs
To 0.1% FSR, CIN = open circuit
Loop Current Slew Rate
400
μA/μs
CIN = open circuit
AC Loop Voltage Sensitivity
1.3
μA/V
1200 Hz to 2200 Hz, 5 V p-p, RL = 3 kΩ
1 Temperature range: −40°C to +105°C; typical at +25°C.
TIMING CHARACTERISTICS
Loop voltage = 24 V; REFIN = 2.5 V external; RL = 250 Ω; all specifications TMIN to TMAX.
Table 4.
Parameter1, 2, 3
Limit at TMIN, TMAX
Unit
Description
t1
33
ns min
SCLK cycle time
t2
17
ns min
SCLK high time
t3
17
ns min
SCLK low time
t4
17
ns min
SYNC falling edge to SCLK falling edge setup time
t5
10
ns min
SCLK falling edge to SYNC rising edge
t6
25
μs min
Minimum SYNC high time
t7
5
ns min
Data setup time
t8
5
ns min
Data hold time
t9
25
μs min
SYNC rising edge to LDAC falling edge
t10
10
ns min
LDAC pulse width low
t11
70
ns max
SCLK rising edge to SDO valid (CL SDO = 30 pF)
t12
0
ns min
SYNC falling edge to SCLK rising edge setup time
t13
70
ns max
SYNC rising edge to SDO tristate (CL SDO = 30 pF)
1 Guaranteed by design and characterization; not production tested.
2 All input signals are specified with tR = tF = 5 ns (10% to 90% of DVDD) and timed from a voltage level of 1.2 V.
3 See Figure 2 and Figure 3.
Table 5. SPI Watchdog Timeout Periods
Parameter1
T0
T1
T2
Min
Typ
Max
Unit
0
0
0
43
50
59
ms
0
0
1
87
100
117
ms
0
1
0
436
500
582
ms
0
1
1
873
1000
1163
ms
1
0
0
1746
2000
2326
ms
1
0
1
2619
3000
3489
ms
1
1
0
3493
4000
4652
ms
1
1
1
4366
5000
5814
ms
1 Specifications guaranteed by design and characterization; not production tested.


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