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Formosa MS

High reliability test capabilities

FMBT3906

PNP Epitaxial Planar Transistor

Document ID

Issued Date

Revised Date

Revision

Page.

1.

2.

3.

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5.

6.

7.

8.

Steady State Operating Life

High Temperature Reverse Bias

Temperature Cycle

Autoclave

High Temperature Storage Life

Solderability

High Temperature High Humidity Reverse

Bias

Resistance to Soldering Heat

P =225mW Test Duration:1000hrs

D

Tj= 150℃, V = 80% related volage, 1000hrs

CE

-55℃(15min) to 150℃(15min)Air to Air Transition Time<20sec Test Cycles:1000cycle

P= 2atm Ta= 121℃ RH= 100% Test Duration: 96hrs

Ta= 150℃ Test Duration: 1000hrs

245℃,5sec

Ta= 85℃, 85% RH, V = 80% related volage, 1000hrs

CE

260℃,10sec

Item Test

Conditions

DS-231113

2008/02/10

2011/07/21

E

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