1

FEATURES

DESCRIPTION

UC1707, UC2707, UC3707

DUAL CHANNEL POWER DRIVER

• Analog Shutdown With Optional Latch

• Two Independent Drivers

• Low Quiescent Current

• 1.5 A Totem Pole Outputs

• 5 V to 40 V Operation

• Inverting and Non-Inverting Inputs

• Thermal Shutdown Protection

• 40 ns Rise and Fall Into 1000 pF

• 16-Pin Dual-In-Line Package

• High-Speed, Power MOSFET Compatible

• 20-Pin PLCC and CLCC Package

• Low Cross-Conduction Current Spike

The UC1707 family of power drivers is made with a high-speed Schottky process to interface between low-level

control functions and high-power switching devices–particularly power MOSFETs. These devices contain two

independent channels, each of which can be activated by either a high or low input logic level signal. Each output

can source or sink up to 1.5 A as long as power dissipation limits are not exceeded.

Although each output can be activated independently with its own inputs, it can be forced low in common through

the action either of a digital high signal at the Shutdown terminal or a differential low-level analog signal. The

Shutdown command from either source can either be latching or not, depending on the status of the Latch

Disable pin.

These devices are available in two-watt plastic "bat-wing" DIP for operation over a 0°C to 70°C temperature

range and, with reduced power, in a hermetically sealed cerdip for –55°C to +125°C operation. Also available in

surface mount DW, Q, L packages.

TRUTH TABLE

INV.

N.I.

OUT

H

H

L

L

H

H

H

L

L

L

L

L

(1)

OUT = INV and N.I.

OUT = INV or N.I.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 1999–2008, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.