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LM3279 Folha de dados(PDF) 4 Page - Texas Instruments |
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LM3279 Folha de dados(HTML) 4 Page - Texas Instruments |
4 / 31 page CLK PWM RAMP + - Error Amp INTERNAL LOOP COMPENSATION CONTROL LOGIC GATE DRIVE CIRCUITS M4 M3 M5 VCON FB M2 M1 1.7A + - INPUT OVER CURRENT PROTECTION SGND PGND VOUT SW2 SW1 EN M6_G M6 M6 _G SMALL FET LARGE FET ONE - SHOT TIMER SVIN PVIN RFFE VIO SDATA SCLK GPO1 GPO0 XOR + - REF FB NETWORK PFM COMPARATOR DGND VSET DAC 7 EN LM3279 SNVS970A – MARCH 2013 – REVISED MAY 2013 www.ti.com BLOCK DIAGRAM This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 4 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: LM3279 |
Nº de peça semelhante - LM3279 |
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Descrição semelhante - LM3279 |
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