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74ABTH182652APMG4 Folha de dados(PDF) 7 Page - Texas Instruments

Nome de Peças 74ABTH182652APMG4
Descrição Electrónicos  SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
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Fabricante Electrônico  TI1 [Texas Instruments]
Página de início  http://www.ti.com
Logo TI1 - Texas Instruments

74ABTH182652APMG4 Folha de dados(HTML) 7 Page - Texas Instruments

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SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18BIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D − AUGUST 1993 − REVISED JULY 1996
7
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251−1443
test architecture
Serial-test information is conveyed by means of a 4-wire test bus or TAP that conforms to IEEE Standard
1149.1-1990. Test instructions, test data, and test control signals are all passed along this serial-test bus. The
TAP controller monitors two signals from the test bus, TCK and TMS. The TAP controller extracts the
synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip
control signals for the test structures in the device. Figure 2 shows the TAP-controller state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and
output data changes on the falling edge of TCK. This scheme ensures data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram shows the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship among the test bus, the TAP controller, and the test registers. As shown, the
device contains an 8-bit instruction register and four test-data registers: a 48-bit boundary-scan register, a 3-bit
boundary-control register, a 1-bit bypass register, and a 32-bit device-identification register.
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
Figure 2. TAP-Controller State Diagram


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