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AD680JR Folha de dados(PDF) 8 Page - Analog Devices |
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AD680JR Folha de dados(HTML) 8 Page - Analog Devices |
8 / 12 page AD680 Rev. H | Page 8 of 12 AD680 +VIN VOUT VOUT VOUT 0V VL 249 Ω 0.1 μF CL 1000pF Figure 12. Capacitive Load Transient Response Test Circuit Figure 13 displays the output amplifier characteristics driving a 1,000 pF, 0 mA to 10 mA load. VOUT VL 100 90 0% 10 5 μs 5mV 2V Figure 13. Output Response with Capacitive Load LOAD REGULATION Figure 14 depicts the load regulation characteristics of the AD680. VOUT VL 100 90 0% 10 100 μs 1mV 1V Figure 14. Typical Load Regulation Characteristics TEMPERATURE PERFORMANCE The AD680 is designed for reference applications where tem- perature performance is important. Extensive temperature testing and characterization ensure that the device’s performance is maintained over the specified temperature range. Some confusion exists in the area of defining and specifying reference voltage error over temperature. Historically, references have been characterized using a maximum deviation per degree centigrade, that is, ppm/°C. However, because of nonlinearities in temperature characteristics that originated in standard Zener references (such as “S” type characteristics), most manufac- turers now use a maximum limit error band approach to specify devices. This technique involves measuring the output at three or more different temperatures to specify an output voltage error band. 2.501 2.500 2.498 TEMPERATURE ( °C) –50 60 020 40 2.499 –10 –30 80 100 SLOPE = TC = VMAX – VMIN (TMAX – TMIN) × 2.5V × 10–6 = 2.501 – 2.498 (85 °C – (–40°C)) × 2.5V × 10–6 = 9.6ppm/ °C Figure 15. Typical AD680AN/AD680AR Temperature Drift Figure 15 shows a typical output voltage drift for the AD680AN/ AD680AR and illustrates the test methodology. The box in Figure 15 is bounded on the left and right sides by the operat- ing temperature extremes, and on the top and bottom by the maximum and minimum output voltages measured over the operating temperature range. The maximum height of the box for the appropriate temperature range and device grade is shown in Table 4. Duplication of these results requires a combination of high accuracy and stable tem- perature control in a test system. Evaluation of the AD680 will produce a curve similar to that in Figure 15, but output readings could vary depending upon the test equipment used. Table 4. Maximum Output Change in mV Maximum Output Change (mV) Device Grade 0°C to 70°C −40°C to +85°C AD680JN/AD680JR 4.375 Not applicable AD680JT 5.250 Not applicable AD680AN Not applicable 6.250 |
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