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ML22Q573-NNNMB Folha de dados(PDF) 6 Page - List of Unclassifed Manufacturers |
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ML22Q573-NNNMB Folha de dados(HTML) 6 Page - List of Unclassifed Manufacturers |
6 / 66 page FEDL2257X-05 ML22Q573/ML2257X PIN DESCRIPTION (2) Pin Symbol I/O Attribute Description Attribute Initial value (*1) 14 CBUSYB O Negative Command processing status signal output pin. This pin outputs a “L” level during command processing. Be sure to enter commands with the CBUSYB pin driven at a “H” level. digital 0 (*1) 16 XTB O Negative Connects to a crystal or a ceramic resonator. When using an external clock, leave this pin open. If a crystal or a ceramic resonator is used, connect it as close to the LSI as possible. clk 1 17 XT I Positive Connects to a crystal or a ceramic resonator. A feedback resistor of around 1 M Ω is built in between this XT pin and the XTB pin. When using an external clock, input the clock from this pin. If a crystal or a ceramic resonator is used, connect it as close to the LSI as possible. clk 0 19* 2 VPP I — Pin for FLASH analysis. Should be connected to DGND. analog 0 20 RESETB I Negative Reset input pin. At “L” level input, the LSI enters the initial state. After a reset input, the entire circuit is stopped and enters a power down state. Upon power-on, input a “L” level to this pin. After the power supply voltage is stabilized, drive this pin at a “H” level. This pin has a pull-up resistor built in. digital 0 (*1) 21 TESTI0 (MODE) I Positive Input pin for testing. Also acts as a Flash rewrite enable pin. Has a pull-down resistor built in. digital 0 22 TESTI1 (nTRST) I Negative Used as either an input pin for testing or a reset input pin for Flash rewriting. Has a pull-down resistor built in. digital 0 23* 2 TESTI2 (TMS) I Positive Used as either an input pin for testing or a state transition pin for Flash rewriting. Has a pull-up resistor built in. digital 1 24* 2 TESTI3 (TDI) I Positive Used as either an input pin for testing or a data input pin for Flash rewriting. Has a pull-up resistor built in. digital 1 25* 2 TESTI4 (TCK) I Positive Used as either an input pin for testing or a clock input pin for Flash rewriting. Has a pull-up resistor built in. digital 0 26* 2 TESTO (TSO) O Positive Used as either an output pin for testing or a data output pin for Flash rewriting. digital Hi-Z 27 SPM O — Output pin of the built-in speaker amplifier. analog Hi-Z 28 SPP O — Output pin of the built-in speaker amplifier. Can be configured as an AOUT amplifier output by command setting. analog 0 29 SPGND — — Speaker amplifier ground pin. gnd — 30 SPVDD — — Speaker amplifier power supply pin. Connect a bypass capacitor of 10 μF or more between this pin and SPGND. power — *1: Indicates the initial value at reset input or during power down. *2: These are NC pins in the ML22573/ML22572. 6/66 |
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