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74HCT541PW Folha de dados(PDF) 11 Page - NXP Semiconductors |
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74HCT541PW Folha de dados(HTML) 11 Page - NXP Semiconductors |
11 / 19 page 74HC_HCT541 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product data sheet Rev. 3 — 15 April 2014 11 of 19 NXP Semiconductors 74HC541; 74HTC541 Octal buffer/line driver; 3-state Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator CL = Load capacitance including jig and probe capacitance RL = Load resistance S1 = Test selection switch Fig 8. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC541 VCC 6ns 15pF, 50 pF 1k open GND VCC 74HCT541 3 V 6 ns 15 pF, 50 pF 1 k open GND VCC |
Nº de peça semelhante - 74HCT541PW |
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Descrição semelhante - 74HCT541PW |
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