LM2476

+8V

+85V

GND

2

14

1, 3, 4

6, 7, 8

5, 10, 12,

16, 18

15, 17, 19

1 k:

0.1 PF

0.1 PF

47 PF

47 PF

9, 11, 13

100:

470:

0.1 PF

2.49 k:

0.1 PF

0.1 PF

Input from

Pulse

Generator

Output to

50: Scope

2.49 k:

330 k:

+85V

50:

1 k:

50:

0.01 PF

0.47 PF

Test

Point

Test

Point

+

+

OBSOLETE

LM2476

SNOSAH7B – JANUARY 2004 – REVISED APRIL 2013

www.ti.com

LM2476 TEST CIRCUITS

Note: 8 pF load includes parasitic capacitance.

Figure 3. CRT Driver and Bias Clamp Test Circuits (One Channel)

Figure 3 shows a typical test circuit to evaluate the LM2476 CRT Driver and Bias Clamp electrical characteristics.

The driver test circuit is designed to allow for testing the transient response in a 50

Ω environment without the use

of an expensive FET probe. An input from a 50

Ω pulse generator output can be AC coupled and biased with an

oscilloscope. The clamp test circuit is designed to allow for testing the clamp outputs. A clamp input can be

measure the DC voltage at the clamp outputs. Test points can included to accommodate voltmeter or

oscilloscope probes.

4

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