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SN74ABT8996 Folha de dados(PDF) 5 Page - Texas Instruments |
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SN74ABT8996 Folha de dados(HTML) 5 Page - Texas Instruments |
5 / 46 page SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS SCBS489C – AUGUST 1994 – REVISED APRIL 1999 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 application information In application, the ASP is used at each of several (serially-chained) groups of IEEE Std 1149.1-compliant devices. The ASP for each such group is assigned an address (via inputs A9–A0) that is unique from that assigned to ASPs for the remaining groups. Each ASP is wired at its primary TAP to common (multidrop) TAP signals (sourced from a central IEEE Std 1149.1 bus master) and fans out its secondary TAP signals to the specific group of IEEE Std 1149.1-compliant devices with which it is associated. An example is shown in Figure 1. ASP IEEE Std 1149.1- Compliant Device Chain A9–A0 ASP IEEE Std 1149.1- Compliant Device Chain A9–A0 ASP IEEE Std 1149.1- Compliant Device Chain A9–A0 TRST TDO TMS TCK TDI IEEE Std 1149.1 Bus Master To Other Modules Figure 1. ASP Application This application allows the ASP to be wired to a 4- or 5-wire multidrop test access bus, such as might be found on a backplane. Each ASP would then be located on a module, for example a printed-circuit board (PCB), which contains a serial chain of IEEE Std 1149.1-compliant devices and which would plug into the module-to-module bus (e.g., backplane). In the complete system, the ASP shadow protocols would allow the selection of the scan chain on a single module. The selected scan chain could then be controlled, via the multidrop TAP, as if it were the only scan chain in the system. Normal IR and DR scans can then be performed to accomplish the module test objectives. Once scan operations to a given module are complete, another module can be selected in the same fashion, at which time the ASP-based connection to the first module is dissolved. This procedure can be continued progressively for each module to be tested. Finally, one of two global addresses can be issued to either leave all modules unselected (disconnect address, DSA) or to deselect and reset scan chains for all modules (reset address, RSA). Additionally, in Pause-DR and Pause-IR TAP states, a third global address (test-synchronization address, TSA) can be invoked to allow simultaneous TAP-state changes and multicast scan-in operations to selected modules. This is especially useful in the former case, for allowing selected modules to be moved simultaneously to the Run-Test-Idle TAP state for module-level or module-to-module built-in self-test (BIST) functions, which operate synchronously to TCK in that TAP state, and in the latter case, for scanning common test setup/data into multiple like modules. |
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