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TLC5618ACD Datasheet(Folha de dados) 6 Page - Texas Instruments

Nome de Peças. TLC5618ACD
descrição  PROGRAMMABLE DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTERS
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Fbricantes  TI1 [Texas Instruments]
Página de início  http://www.ti.com
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TLC5618, TLC5618A
PROGRAMMABLE DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS156G – JULY 1997 – REVISED APRIL 2001
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range, VDD = 5 V ± 5%,
Vref(REFIN) = 2.048 V (unless otherwise noted) (continued)
reference input (REFIN)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VI
Input voltage range
0
VDD– 2
V
Ri
Input resistance
10
M
Ci
Input capacitance
5
pF
Reference feedthrough
REFIN = 1 Vpp at 1 kHz + 1.024 V dc (see Note 9)
– 60
dB
Reference input bandwidth (f
3 dB)
REFIN = 0 2 V
+ 1 024 V dc
Slow
0.5
MHz
Reference input bandwidth (f – 3 dB)
REFIN = 0.2 Vpp + 1.024 V dc
Fast
1
MHz
NOTE 9: Reference feedthrough is measured at the DAC output with an input code = 000 hex and a Vref(REFIN) input = 1.024 V dc + 1 Vpp at 1
kHz.
digital inputs (DIN, SCLK, CS)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IIH
High-level digital input current
VI = VDD
±1
µA
IIL
Low-level digital input current
VI = 0 V
±1
µA
Ci
Input capacitance
8
pF
power supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IDD
Power supply current
VDD = 5.5 V,
No load
Slow
0.6
1
mA
IDD
Power supply current
No load,
All inputs = 0 V or VDD
Fast
1.6
2.5
mA
Power down supply current
D13 = 0 (see Table 2)
1
µA
operating characteristics over recommended operating free-air temperature range, VDD = 5 V ± 5%,
Vref(REFIN) = 2.048 V (unless otherwise noted)
analog output dynamic performance
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SR+
Output slew rate positive
CL = 100 pF,
RL 10 kΩ
Vref(REFIN) = 2.048 V,
TA =25°C
Slow
0.3
0.5
V/
µs
SR+
Output slew rate, positive
RL = 10 kΩ,
Code 32 to Code 4096,
TA = 25°C,
VO from 10% to 90%
Fast
2.4
3
V/
µs
SR
Output slew rate negative
CL = 100 pF,
RL 10 kΩ
Vref(REFIN) = 2.048 V,
TA =25°C
Slow
0.15
0.25
V/
µs
SR–
Output slew rate, negative
RL = 10 kΩ,
Code 4096 to Code 32,
TA = 25°C,
VO from 10% to 90%
Fast
1.2
1.5
V/
µs
t
Output settling time
To
±0.5 LSB,
CL = 100 pF,
Slow
12.5
µs
ts
Output settling time
,
RL = 10 kΩ,
See Note 10
Fast
2.5
µs
t ()
Output settling time,
To
±0.5 LSB,
CL = 100 pF,
Slow
2
µs
ts(c)
g,
code-to-code
,
RL = 10 kΩ,
See Note 11
Fast
2
µs
Glitch energy
DIN = All 0s to all 1s,
f(SCLK) = 100 kHz
CS = VDD,
5
nV–s
S/(N+D)
Signal to noise + distortion
Vref(REFIN) = 1 Vpp at 1 kHz and 10 kHz + 1.024 V dc,
Input code = 10 0000 0000
78
dB
NOTES: 10. Settling time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of 020 hex to 3FF hex or 3FF hex to 020 hex.
11. Settling time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of one count.




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