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MC100EPT21DR2G Folha de dados(PDF) 4 Page - ON Semiconductor |
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4 / 9 page MC100EPT21 http://onsemi.com 4 Table 5. LVTTL/LVCMOS OUTPUT DC CHARACTERISTICS VCC = 3.3 V, GND = 0.0 V, TA = −40°C to 85°C Symbol Characteristic Condition Min Typ Max Unit VOH Output HIGH Voltage IOH = −3.0 mA 2.4 V VOL Output LOW Voltage IOL = 24 mA 0.5 V ICCH Power Supply Current Outputs set to HIGH 5 17 25 mA ICCL Power Supply Current Outputs set to LOW 8 21 30 mA IOS Output Short Circuit Current −130 −80 mA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. Table 6. AC CHARACTERISTICS VCC = 3.0 V to 3.6 V, GND = 0.0 V (Note 5) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max fmax Maximum Frequency (Figure 2) 275 350 275 350 275 350 MHz tPLH, tPHL Propagation Delay to Output Differential 800 1200 1400 1400 2050 1800 800 1200 1400 1400 2250 1800 900 1100 1600 1300 2950 1900 ps tSKEW Duty Cycle Skew (Note 6) 45 50 55 45 50 55 45 50 55 % tSKPP Part−to−Part Skew (Note 6) 500 500 500 ps tJITTER Random Clock Jitter (RMS) 3.5 5 3.5 5 3.5 5 ps VPP Input Voltage Swing (Differential Configuration) 150 800 1200 150 800 1200 150 800 1200 mV tr tf Output Rise/Fall Times (0.8V − 2.0V) Q, Q 250 600 900 250 600 900 250 600 900 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 5. Measured with a 750 mV 50% duty−cycle clock source. RL = 500 W to GND and CL = 20 pF to GND. Refer to FIgure 3. 6. Skews are measured between outputs under identical transitions. Duty cycle skew is measured between differential outputs using the deviations of the sum Tpw− and Tpw+. |
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