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CQ-3202 Folha de dados(PDF) 17 Page - Asahi Kasei Microsystems |
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CQ-3202 Folha de dados(HTML) 17 Page - Asahi Kasei Microsystems |
17 / 19 page [CQ-3202] 016008764-E-00 2016/07 - 17 - 14. Reliability Tests Table 7. Test parameters and conditions of reliability tests. No. Test Parameter Test Conditions n Test Time 1 High Humidity Bias Test [JEITA EIAJ ED-4701 102] Ta = 85C, 85%RH, continuous operation 22 1000h 2 High Temperature Bias Test [JEITA EIAJ ED-4701 101] Ta = 125C, continuous operation 22 1000h 3 High Temperature Storage Test [JEITA EIAJ ED-4701 201] Ta = 150C 22 1000h 4 Low Temperature Storage Test [JEITA EIAJ ED-4701 202] Ta = −65C 22 1000h 5 Heat Cycle Test [JEITA EIAJ ED-4701 105] −65C ↔150C 30min. ↔ 30min. Tested in vapor phase 22 100 cycles Tested samples are pretreated as below before each reliability test: Desiccation: 125C/24h → Moisture Absorption: 60C/60%RH/120h → Reflow: 3 times (JEDEC Level2a) Criteria: Products whose drifts before and after the reliability tests do not exceed the values below are considered to be in spec. Sensitivity Vh (Ta=35C) : Within ±1.5% Zero-current output Voltage Vof (Ta=35C) : Within ±66mV Linearity ρ (T a=35C) : Within ±1%F.S. EEPROM data : Unchanged |
Nº de peça semelhante - CQ-3202_16 |
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Descrição semelhante - CQ-3202_16 |
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