TLP2530,TLP2531

2002-09-25

4

Characteristic

Symbol

Test

Cir

-

cuit

Test Condition

Min.

Typ.

Max.

Unit

TLP2530

―

0.3

1.5

Propagation delay

time to logic low

at output

(each channel)

TLP2531

1

―

0.2

0.8

µs

TLP2530

―

0.5

1.5

Propagation delay

time to logic

high at output

(each channel)

TLP2531

1

―

0.3

0.8

µs

TLP2530

―

1500

―

Common mode

transient

immunity at logic

high level output

(each channel,

Note 9)

TLP2531

2

―

1500

―

V / µs

TLP2530

―

-1500

―

Common mode

transient

immunity at logic

low level output

(each channel,

Note 9)

TLP2531

2

―

-1500

―

V / µs

Bandwidth

(each channel, Note 10)

BW

3

―

2

―

(Note 7) Device considered a two

-terminal device: Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7, and

8 shorted together.

(Note 8) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together.

(Note 9) Common mode transient immunity in logic high level is the maximum tolerable (positive) dVcm / dt

on the leading egde of the common mode pulse, Vcm, to assure that the output will remain in a

Common mode transient immunity in logic low Level is the maximum tolerable (negative) dVcm / dt

on the trailing edge of the common mode pulse signal, Vcm, to assure that the output will remain in

(Note 10) The frequency at which the ac output voltage is 3dB below the low frequency asymptote.