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CY7C1541KV18 Folha de dados(PDF) 23 Page - Cypress Semiconductor

Nome de Peças CY7C1541KV18
Descrição Electrónicos  72-Mbit QDR짰II SRAM 4-Word BurstArchitecture (2.0 Cycle Read Latency)
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Fabricante Electrônico  CYPRESS [Cypress Semiconductor]
Página de início  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C1541KV18 Folha de dados(HTML) 23 Page - Cypress Semiconductor

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CY7C1541KV18, CY7C1556KV18
CY7C1543KV18, CY7C1545KV18
Document Number: 001-15700 Rev. *F
Page 23 of 27
Switching Characteristics
Over the Operating Range [23, 24]
Cypress
Parameter
Consortium
Parameter
Description
450 MHz
400 MHz
375 MHz
333 MHz
Unit
Min
Max
Min
Max
Min
Max
Min
Max
tPOWER
VDD(Typical) to the First Access
[25]
111
1
ms
tCYC
tKHKH
K Clock Cycle Time
2.2
8.4
2.5
8.4
2.66
8.4
3.0
8.4
ns
tKH
tKHKL
Input Clock (K/K) HIGH
0.4–0.4
–0.4–0.4
ns
tKL
tKLKH
Input Clock (K/K) LOW
0.4–0.4
–0.4–0.4
ns
tKHKH
tKHKH
K Clock Rise to K Clock Rise
(rising edge to rising edge)
0.94
–1.06–
1.13–1.28
ns
Setup Times
tSA
tAVKH
Address Setup to K Clock Rise
0.275
0.4
0.4
0.4
ns
tSC
tIVKH
Control Setup to K Clock Rise (RPS, WPS)
0.275
–0.4
–0.4–0.4
ns
tSCDDR
tIVKH
DDR Control Setup to Clock (K/K) Rise
(BWS0, BWS1, BWS2, BWS3)
0.22
–0.28–
0.28–0.28
ns
tSD
tDVKH
D[X:0] Setup to Clock (K/K) Rise
0.22
–0.28–
0.28–0.28
ns
Hold Times
tHA
tKHAX
Address Hold after K Clock Rise
0.275
–0.4
–0.4–0.4
ns
tHC
tKHIX
Control Hold after K Clock Rise (RPS, WPS)
0.275
–0.4
–0.4–0.4
ns
tHCDDR
tKHIX
DDR Control Hold after Clock (K/K) Rise
(BWS0, BWS1, BWS2, BWS3)
0.22
–0.28–
0.28–0.28
ns
tHD
tKHDX
D[X:0] Hold after Clock (K/K) Rise
0.22
–0.28–
0.28–0.28
ns
Output Times
tCO
tCHQV
K/K Clock Rise to Data Valid
0.45–
0.45
–0.45–
0.45
ns
tDOH
tCHQX
Data Output Hold after Output K/K Clock Rise
(Active to Active)
–0.45
–0.45
–0.45
–0.45
ns
tCCQO
tCHCQV
K/K Clock Rise to Echo Clock Valid
0.45–
0.45
–0.45–
0.45
ns
tCQOH
tCHCQX
Echo Clock Hold after K/K Clock Rise
–0.45
–0.45
–0.45
–0.45
ns
tCQD
tCQHQV
Echo Clock High to Data Valid
0.15
0.20
0.20
0.20
ns
tCQDOH
tCQHQX
Echo Clock High to Data Invalid
–0.15
–0.20
–0.20
–0.20
ns
tCQH
tCQHCQL
Output Clock (CQ/CQ) HIGH [26]
0.85
1.0
1.08
1.25
ns
tCQHCQH
tCQHCQH
CQ Clock Rise to CQ Clock Rise
(rising edge to rising edge)
[26]
0.85
1.0
1.08
1.25
ns
tCHZ
tCHQZ
Clock (K/K) Rise to High Z
(Active to High Z) [27, 28]
0.45–
0.45
–0.45–
0.45
ns
tCLZ
tCHQX1
Clock (K/K) Rise to Low Z [27, 28]
–0.45
–0.45
–0.45
–0.45
ns
tQVLD
tCQHQVLD
Echo Clock High to QVLD Valid [29]
–0.15 0.15 –0.20 0.20 –0.20 0.20 –0.20 0.20
ns
PLL Timing
tKC Var
tKC Var
Clock Phase Jitter
0.15
0.20
0.20
0.20
ns
tKC lock
tKC lock
PLL Lock Time (K)
20–20–20–20–
μs
tKC Reset
tKC Reset
K Static to PLL Reset [30]
30
30
30
30
ns
Notes
24. When a part with a maximum frequency above 333 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is being
operated and outputs data with the output timings of that frequency range.
25. This part has a voltage regulator internally; tPOWER is the time that the power must be supplied above VDD minimum initially before a read or write operation can be
initiated.
26. These parameters are extrapolated from the input timing parameters (tCYC/2 - 250 ps, where 250 ps is the internal jitter). These parameters are only guaranteed by
design and are not tested in production.
27. tCHZ, tCLZ, are specified with a load capacitance of 5 pF as in (b) of “AC Test Loads and Waveforms” on page 22. Transition is measured ± 100 mV from steady-state
voltage.
28. At any voltage and temperature tCHZ is less than tCLZ and tCHZ less than tCO.
29. tQVLD spec is applicable for both rising and falling edges of QVLD signal.
30. Hold to >VIH or <VIL.
[+] Feedback


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