BTS3035EJ datasheet(9/45 Pages) INFINEON

Nome de Peças	BTS3035EJ

Descrição Electrónicos	Smart Low-Side Power Switch

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Fabricante Electrônico	INFINEON [Infineon Technologies AG]

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9 / 45 page

Datasheet

9

Rev. 1.0

2016-09-12

HITFET - BTS3035EJ

Smart Low-Side Power Switch

General Product Characteristics

Notes

1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

Unclamped repetitive

inductive energy pulse with

100k cycles

EAR(100k)

––

84

mJ

IL(0) = IL(NOM)

VBAT = 13.5 V

TJ(0) = 105 °C

P_4.1.36

Unclamped repetitive

inductive energy pulse with

1M

EAR(1M)

––

67

mJ

IL(0) = IL(NOM)

VBAT = 13.5 V

TJ(0) = 105 °C

P_4.1.42

Temperatures

Operating temperature

TJ

-40

–

+150 °C

–

P_4.1.52

Storage temperature

TSTG

-55

–

+150 °C

–

P_4.1.53

ESD Susceptibility

ESD susceptibility (all pins)

VESD

-3

–

3

kV

HBM4)

P_4.1.54

ESD susceptibility OUT-pin to

GND

VESD

-10

–

10

kV

HBM5)

P_4.1.55

ESD susceptibility

VESD

-1

–

1

kV

CDM6)

P_4.1.56

ESD susceptibility non-

corner pins

VESD

-1

–

1

kV

CDM7)

P_4.1.57

1) Not subject to production test, specified by design.

2) VBAT(LD) is setup without the DUT connected to the generator per ISO 7637-1;

RI is the internal resistance of the load dump test pulse generator;

tD is the pulse duration time for load dump pulse (pulse 5) according ISO 7637-1, -2.

3) Maximum allowed value. Consider also inverse input current in inverse condition IIN(-VOUT) in Chapter 9

4) ESD susceptibility, HBM according to ANSI/ESDA/JEDEC JS001 (1.5 kΩ, 100 pF)

5) ESD susceptibility, HBM according to ANSI/ESDA/JEDEC JS001 (1.5 kΩ, 100 pF)

6) ESD susceptibility, Charged Device Model “CDM” ESDA STM5.3.1 or ANSI/ESD S.5.3.1

7) ESD susceptibility, Charged Device Model “CDM” ESDA STM5.3.1 or ANSI/ESD S.5.3.1

Table 2

Absolute Maximum Ratings 1) (cont’d)

Tj = -40°C to +150°C; all voltages with respect to ground, positive current flowing into pin (unless otherwise

specified)

Parameter

Symbol

Values

Unit

Note or Test Condition

Number

Min. Typ. Max.

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