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DAC0807LCJ Folha de dados(PDF) 6 Page - National Semiconductor (TI) |
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DAC0807LCJ Folha de dados(HTML) 6 Page - National Semiconductor (TI) |
6 / 10 page Test Circuits TLH5687 – 6 VI and I1 apply to inputs A1–A8 The resistor tied to pin 15 is to temperature compensate the bias current and may not be necessary for all applications IO e K A12aA24aA38aA416aA532aA664a A7128a A8256J where K j VREF R14 and AN e ‘‘1’’ if AN is at high level AN e ‘‘0’’ if AN is at low level FIGURE 3 Notation Definitions Test Circuit (Note 7) TLH5687 – 7 FIGURE 4 Relative Accuracy Test Circuit (Note 7) TLH5687 – 8 FIGURE 5 Transient Response and Settling Time (Note 7) 6 |
Nº de peça semelhante - DAC0807LCJ |
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Descrição semelhante - DAC0807LCJ |
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