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Os motores de busca de Datasheet de Componentes eletrônicos |
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RM48L940 Folha de dados(PDF) 40 Page - Texas Instruments |
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RM48L940 Folha de dados(HTML) 40 Page - Texas Instruments |
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40 / 174 page  RM48L940, RM48L740, RM48L540 SPNS175C – APRIL 2012 – REVISED JUNE 2015 www.ti.com 5 Specifications 5.1 Absolute Maximum Ratings (1) Over Operating Free-Air Temperature Range MIN MAX UNIT VCC (2) –0.3 1.43 Supply voltage VCCIO, VCCP (2) –0.3 4.6 V VCCAD –0.3 6.25 All input pins –0.3 4.6 Input voltage V ADC input pins –0.3 6.25 IIK (VI < 0 or VI > VCCIO) –20 20 All pins, except AD1IN[23:0] and AD2IN[15:0] mA Input clamp current IIK (VI < 0 or VI > VCCAD) –10 10 AD1IN[23:0] and AD2IN[15:0] Total –40 40 mA Operating free-air temperature, TA: –40 105 °C Operating junction temperature, TJ: –40 130 °C Storage temperature, Tstg –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated grounds. 5.2 ESD Ratings VALUE UNIT Human body model (HBM), per ANSI/ESDA/JEDEC JS001(1) ±2 kV VESD Electrostatic discharge (ESD) performance: Charged device model (CDM), per JESD22-C101(2) All pins ±250 V (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 5.3 Power-On Hours (POH) (1) (2) JUNCTION NOMINAL CORE VOLTAGE (VCC) LIFETIME POH TEMPERATURE (Tj) 1.2 105ºC 100K (1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms and conditions for TI semiconductor products. (2) To avoid significant degradation, the device power-on hours (POH) must be limited to those specified in this table. To convert to equivalent POH for a specific temperature profile, see the Calculating Equivalent Power-on-Hours for Hercules Safety MCUs Application Report (SPNA207). 40 Specifications Copyright © 2012–2015, Texas Instruments Incorporated Submit Documentation Feedback |
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