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74ABT04PWDH Folha de dados(PDF) 3 Page - NXP Semiconductors |
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74ABT04PWDH Folha de dados(HTML) 3 Page - NXP Semiconductors |
3 / 10 page Philips Semiconductors Product Specification 74ABT04 Hex inverter 1995 Sep 18 3 ABSOLUTE MAXIMUM RATINGS1, 2 SYMBOL PARAMETER CONDITIONS RATING UNIT VCC DC supply voltage –0.5 to +7.0 V IIK DC input diode current VI < 0 –18 mA VI DC input voltage3 –1.2 to +7.0 V IOK DC output diode current VO < 0 –50 mA VOUT DC output voltage3 output in Off or High state –0.5 to +5.5 V IOUT DC output current output in Low state 40 mA Tstg Storage temperature range –65 to 150 °C NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C. 3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN MAX UNIT VCC DC supply voltage 4.5 5.5 V VI Input voltage 0 VCC V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IOH High-level output current –15 mA IOL Low-level output current 20 mA ∆t/∆v Input transition rise or fall rate 0 5 ns/V Tamb Operating free-air temperature range –40 +85 °C DC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITIONS Tamb = +25°C Tamb = –40°C to +85 °C UNIT MIN TYP MAX MIN MAX VIK Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V VOH High-level output voltage VCC = 4.5V; IOH = –15mA; VI = VIL or VIH 2.5 2.9 2.5 V VOL Low-level output voltage VCC = 4.5V; IOL = 20mA; VI = VIL or VIH 0.35 0.5 0.5 V II Input leakage current VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA IOFF Power-off leakage current VCC = 0.0V; VO or VI ≤ 4.5V ±5.0 ±100 ±100 µA ICEX Output High leakage current VCC = 5.5V; VO = 5.5V; VI = GND or VCC 5.0 50 50 µA IO Output current1 VCC = 5.5V; VO = 2.5V –50 –75 –180 –50 –180 mA ICC Quiescent supply current VCC = 5.5V; VI = GND or VCC 2 50 50 µA ∆ICC Additional supply current per input pin2 VCC = 5.5V; One data input at 3.4V, other inputs at VCC or GND 0.25 500 500 µA NOTES: 1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second. 2. This is the increase in supply current for each input at 3.4V. |
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Descrição semelhante - 74ABT04PWDH |
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