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74F198 Folha de dados(PDF) 6 Page - NXP Semiconductors |
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74F198 Folha de dados(HTML) 6 Page - NXP Semiconductors |
6 / 12 page Philips Semiconductors Product specification 74F198 8-bit bidirectional universal shift register October 2, 1987 6 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 V VOH High-level output voltage VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.35 0.50 V VOL Low-level output voltage VIH = MIN, IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total) ICCH VCC = MAX 70 100 mA ICC Supply current (total) ICCL VCC = MAX 75 110 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
Nº de peça semelhante - 74F198 |
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Descrição semelhante - 74F198 |
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