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74F2953 Folha de dados(PDF) 7 Page - NXP Semiconductors |
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74F2953 Folha de dados(HTML) 7 Page - NXP Semiconductors |
7 / 14 page Philips Semiconductors Product specification 74F2952, 74F2953 Transceivers 1989 Sep 22 7 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT A0 A7 IO = 3mA ±10% VCC 2.4 V VO High level output voltage A0–A7 VCC = MIN, VIL = MAX IOH = –3mA ±5% VCC 2.7 3.3 V VOH High-level output voltage B0 B7 VIL = MAX, VIH = MIN IO = 15mA ±10% VCC 2.0 V B0–B7 IOH = –15mA ±5% VCC 2.0 V A0 A7 IO = 24mA ±10% VCC 0.35 0.50 V VO Low level output voltage A0–A7 VCC = MIN, VIL = MAX IOL = 24mA ±5% VCC 0.35 0.50 V VOL Low-level output voltage B0 B7 VIL = MAX, VIH = MIN IOL = 48mA ±10% VCC 0.38 0.55 V B0–B7 IOL = 64mA ±5% VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage CPAB, CPBA, OEAB, OEBA, CEAB, CEBA VCC = 5.5V, VI = 7.0V 100 µA I in ut voltage A0–A7, B0–B7 VCC = 5.5V, VI = 5.5V 1 mA IIH High-level input current CPAB, CPBA, OEAB, OEBA, CEAB, CEBA VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current CPAB, CPBA, OEAB, OEBA, CEAB, CEBA VCC = MAX, VI = 0.5V –0.6 mA IIH+IOZH Off-state output current High-level voltage applied A0–A7, B0–B7 VCC = MAX, VO = 2.7V 70 µA IIL+IOZL Off-state output current Low-level voltage applied A0–A7, B0–B7 VCC = MAX, VO = 0.5V –600 µA IOS Short circuit output current3 A0–A7 VCC = MAX VO =0V –60 –150 mA IOS Short-circuit output current3 B0–B7 VCC = MAX, VO = 0V –100 –225 mA ICCH 90 140 mA ICC Supply current (total) iCCL VCC = MAX 120 175 mA ICCZ 105 155 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
Nº de peça semelhante - 74F2953 |
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Descrição semelhante - 74F2953 |
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