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74LVC86AN Folha de dados(PDF) 3 Page - NXP Semiconductors

Nome de Peças 74LVC86AN
Descrição Electrónicos  Quad 2-input exclusive OR gate
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Fabricante Electrônico  PHILIPS [NXP Semiconductors]
Página de início  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LVC86AN Folha de dados(HTML) 3 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74LVC86A
Quad 2-input exclusive OR gate
1998 Apr 28
3
LOGIC SYMBOL
4B
4A
SV00480
1A
1B
2A
2B
3B
3A
1Y
2Y
3Y
4Y
1
2
4
5
13
12
10
9
3
6
11
8
LOGIC DIAGRAM (ONE GATE)
SV00478
A
B
Y
FUNCTION TABLE
INPUTS
OUTPUTS
nA
nB
nY
L
L
L
L
H
H
H
L
H
H
H
L
NOTES:
H = HIGH voltage level
L
= LOW voltage level
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
VCC
DC supply voltage (for max. speed performance)
2.7
3.6
V
VCC
DC supply voltage (for low-voltage applications)
1.2
3.6
V
VI
DC Input voltage range
0
5.5
V
VO
DC output voltage range
0
VCC
V
Tamb
Operating ambient temperature range in free-air
–40
+85
°C
tr, tf
Input rise and fall times
VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS1
Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage (for max. speed
performance)
–0.5 to +6.5
V
IIK
DC input diode current
VI t0
–50
mA
VI
DC input voltage
Note 2
–0.5 to +5.5
V
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VO
DC output voltage
Note 2
–0.5 to VCC + 0.5
V
IO
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC
DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–65 to +150
°C
Power dissipation per package
PTOT
– plastic mini-pack (SO)
above +70
°C derate linearly with 8 mW/K
500
mW
– plastic shrink mini-pack (SSOP and TSSOP)
above +60
°C derate linearly with 5.5 mW/K
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.


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