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CAT5127 Folha de dados(PDF) 4 Page - Catalyst Semiconductor

Nome de Peças. CAT5127
descrição  32-Tap Digitally Programmable Potentiometer (DPP TM)
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Fbricantes  CATALYST [Catalyst Semiconductor]
Página de início  http://www.catalyst-semiconductor.com
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CAT5127 Folha de dados(HTML) 4 Page - Catalyst Semiconductor

 
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CAT5127, CAT5129
Doc. No. 2127 Rev. A
4
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters
Ratings
Units
Supply Voltage
VCC to GND
-0.5 to +7V
V
Inputs
CS
¯¯ to GND
-0.5 to VCC +0.5
V
INC
¯¯¯ to GND
-0.5 to VCC +0.5
V
U/D
¯ to GND
-0.5 to VCC +0.5
V
H to GND
-0.5 to VCC +0.5
V
L to GND
-0.5 to VCC +0.5
V
W to GND
-0.5 to VCC +0.5
V
Parameters
Ratings
Units
Operating Ambient Temperature
Commercial (‘C’ or Blank suffix)
0 to 70
ºC
Industrial (‘I’ suffix)
-40 to +85
ºC
Junction Temperature
+150
ºC
Storage Temperature
-65 to 150
ºC
Lead Soldering (10 sec max)
+300
ºC
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Test Method
Min
Typ
Max
Units
VZAP
(2)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
V
ILTH
(2) (3)
Latch-Up
JEDEC Standard 17
100
mA
TDR
Data Retention
MIL-STD-883, Test Method 1008
100
Years
NEND
Endurance
MIL-STD-883, Test Method 1003
1,000,000
Stores
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from -1V to VCC + 1V
(4) These parameters are periodically sampled and are not 100% tested.


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