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DESCRIPTION (CONTINUED)

ABSOLUTE MAXIMUM RATINGS

TPA6112A2

SLOS342A – DECEMBER 2000 – REVISED SEPTEMBER 2004

These devices have limited built-in ESD protection. The leads should be shorted together or the device

placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

THD+N when driving an 16-

Ω load from 5 V is 0.03% at 1 kHz, and less than 1% across the audio band of 20 Hz

to 20 kHz. For 32-

Ω loads, the THD+N is reduced to less than 0.02% at 1 kHz, and is less than 1% across the

audio band of 20 Hz to 20 kHz. For 10-k

Ω loads, the THD+N performance is 0.005% at 1 kHz, and less than

0.5% across the audio band of 20 Hz to 20 kHz.

AVAILABLE OPTIONS

PACKAGED DEVICE

MSOP SYMBOLIZATION

-40

°C to 85°C

TPA6112A2DGQ

TI APD

(1)

The DGQ package isavailable in left-ended tape and reel only (e.g., TPA6112A2DGQR).

Terminal Functions

TERMINAL

I/O

DESCRIPTION

NAME

NO

BYPASS

4

I

Tap to voltage divider for internal mid-supply bias supply. Connect to a 0.1 µF to 1 µF low ESR capacitor

for best performance.

GND

5

I

GND is the ground connection.

IN1-

2

I

IN1- is the negative input for channel 1.

IN1+

3

I

IN1+ is the positive input for channel 1.

IN2-

8

I

IN2- is the negative input for channel 2.

IN2+

7

I

IN2+ is the positive input for channel 2.

SHUTDOWN

6

I

Puts the device in a low quiescent current mode when held high.

10

I

1

O

9

O

UNITS

Supply voltage

6 V

Input voltage

Continuous total power dissipation

internally limited

Operating junction temperature range

-40

°C to 150°C

Storage temperature range

-65

°C to 150°C

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds

260

°C

(1)

Stresses beyond thoselisted under absolute maximum ratings may cause permanent damage to the device.These are stress ratings

only, and functional operation of the device at theseor any other conditions beyond those indicated under recommended

operatingconditions is not implied. Exposure to absolute-maximum-rated conditions forextended periods may affect device reliability.

2