TC74HC390AP/AF/AFN

2007-10-01

4

(2)

BI-quinary count sequence (Note)

Note:

QD connected to CKA

Absolute Maximum Ratings (Note 1)

Characteristics

Symbol

Rating

Unit

Supply voltage range

−0.5~7

V

DC input voltage

V

DC output voltage

V

Input diode current

±20

mA

Output diode current

±20

mA

DC output current

±25

mA

±50

mA

Power dissipation

500 (DIP) (Note 2)/180 (SOP)

mW

Storage temperature

−65~150

°C

Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or

even destruction.

Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly

even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute

maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Note 2: 500 mW in the range of Ta

= −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be

applied until 300 mW.

Operating Ranges (Note)

Characteristics

Symbol

Rating

Unit

Supply voltage

2~6

V

Input voltage

V

Output voltage

V

Operating temperature

−40~85

°C

Input rise and fall time

ns

Note:

The operating ranges must be maintained to ensure the normal operation of the device.

Unused inputs must be tied to either VCC or GND.