©1990 Fairchild Semiconductor Corporation

www.fairchildsemi.com

74ACTQ08 Rev. 1.3

3

DC Electrical Characteristics

Notes:

1. All outputs loaded; thresholds on input associated with output under test.

2. Maximum test duration 2.0ms, one output loaded at a time.

3. Max number of outputs defined as (n). Data inputs are 0V to 3V. One output @ GND.

4. Max number of data inputs (n) switching. (n–1) inputs switching 0V to 3V. Input-under-test switching:

Symbol

Parameter

Conditions

Units

Typ.

Guaranteed Limits

Minimum HIGH Level

Input Voltage

4.5

1.5

2.0

2.0

V

5.5

1.5

2.0

2.0

Maximum LOW Level

Input Voltage

4.5

1.5

0.8

0.8

V

5.5

1.5

0.8

0.8

Minimum HIGH Level

Output Voltage

4.5

4.49

4.4

4.4

V

5.5

5.49

5.4

5.4

4.5

3.86

3.76

5.5

(1)

4.86

4.76

Maximum LOW Level

Output Voltage

4.5

0.001

0.1

0.1

V

5.5

0.001

0.1

0.1

4.5

0.36

0.44

5.5

(1)

0.36

0.44

Maximum Input

Leakage Current

5.5

±0.1

±1.0

µA

5.5

0.6

1.5

mA

Minimum Dynamic

5.5

75

mA

5.5

–75

mA

Maximum Quiescent

Supply Current

5.5

2.0

20.0

µA

Quiet Output Maximum

5.0

1.1

1.5

V

Quiet Output Minimum

5.0

–0.6

–1.2

V

Minimum HIGH Level

Dynamic Input Voltage

5.0

(4)

1.9

2.2

V

Maximum LOW Level

Dynamic Input Voltage

5.0

(4)

1.2

0.8

V