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HCF4013BC1 Folha de dados(PDF) 5 Page - STMicroelectronics

Nome de Peças HCF4013BC1
Descrição Electrónicos  NAND GATES
Download  12 Pages
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Fabricante Electrônico  STMICROELECTRONICS [STMicroelectronics]
Página de início  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

HCF4013BC1 Folha de dados(HTML) 5 Page - STMicroelectronics

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TEST CIRCUITS
Quiescent Device Current.
Noise Immunity.
Input Leakage Current.
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb =25°C, CL = 50pF, RL = 200kΩ,
typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall times = 20ns)
Val ue
Symbol
Parameter
Test Conditions
V DD (V) Min.
Typ.
Max.
Unit
t PL H,tPHL Propagation Delay Time
5
125
250
ns
10
60
120
15
45
90
t THL,tTLH Transition Time
5
100
200
ns
10
50
100
15
40
80
HCC/HCF4011B/12B/23B
5/12


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