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74FCT162H245ETPVCT Folha de dados(PDF) 3 Page - Texas Instruments |
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74FCT162H245ETPVCT Folha de dados(HTML) 3 Page - Texas Instruments |
3 / 17 page CY74FCT16245T CY74FCT162245T CY74FCT162H245T 3 Output Drive Characteristics for CY74FCT16245T Parameter Description Test Conditions Min. Typ.[5] Max. Unit VOH Output HIGH Voltage VCC=Min., IOH=–3 mA 2.5 3.5 V VCC=Min., IOH=–15 mA 2.4 3.5 V VCC=Min., IOH=–32 mA 2.0 3.0 V VOL Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V Output Drive Characteristics for CY74FCT162245T, CY74FCT162H245T Parameter Description Test Conditions Min. Typ.[5] Max. Unit IODL Output LOW Current[8] VCC=5V, VIN=VIH or VIL, VOUT=1.5V 60 115 150 mA IODH Output HIGH Current[8] VCC=5V, VIN=VIH or VIL, VOUT=1.5V –60 –115 –150 mA VOH Output HIGH Voltage VCC=Min., IOH=–24 mA 2.4 3.3 V VOL Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V Notes: 5. Typical values are at VCC=5.0V, TA=+25˚C ambient. 6. This parameter is specified but not tested. 7. Pins with bus hold are described in Pin Description. 8. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. 9. Tested at +25˚C. Capacitance[6] (TA = +25˚C, f = 1.0 MHz) Parameter Description Test Conditions Typ.[5] Max. Unit CIN Input Capacitance VIN = 0V 4.5 6.0 pF COUT Output Capacitance VOUT = 0V 5.5 8.0 pF |
Nº de peça semelhante - 74FCT162H245ETPVCT |
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Descrição semelhante - 74FCT162H245ETPVCT |
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