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SMP100LC-XXX Folha de dados(PDF) 5 Page - STMicroelectronics |
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SMP100LC-XXX Folha de dados(HTML) 5 Page - STMicroelectronics |
5 / 8 page SMP100LC-xxx 5/8 FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT 1 : GO-NO GO TEST R -VP V BAT = - 48 V Surge generator D.U.T. This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000 µs. - The D.U.T. will come back to the off-state within 50 ms max. 1 2 5 10 20 50 100 200 0.0 0.5 1.0 1.5 2.0 2.5 VR(V) C [VR] / C [VR=50V] Fig 5 : Variation of junction capacitance versus re- verse voltage applied (typical values). |
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