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74FCT163H501CPACT Folha de dados(PDF) 3 Page - Texas Instruments |
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74FCT163H501CPACT Folha de dados(HTML) 3 Page - Texas Instruments |
3 / 9 page CY74FCT163501 CY74FCT163H501 3 Electrical Characteristics for Non Bus Hold Devices Over the Operating Range VCC = 2.7V to 3.6V Parameter Description Test Conditions Min. Typ.[8] Max. Unit VIH Input HIGH Voltage All Inputs 2.0 5.5 V VIL Input LOW Voltage 0.8 V VH Input Hysteresis[9] 100 mV VIK Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V IIH Input HIGH Current VCC=Max., VI=5.5 ±1 µA IIL Input LOW Current VCC=Max., VI=GND ±1 µA IOZH High Impedance Output Current (Three-State Output pins) VCC=Max., VOUT=5.5V ±1 µA IOZL High Impedance Output Current (Three-State Output pins) VCC=Max., VOUT=GND ±1 µA IOS Short Circuit Current[10] VCC=Max., VOUT=GND –60 –135 –240 mA IOFF Power-Off Disable VCC=0V, VOUT≤4.5V ±100 µA ICC Quiescent Power Supply Current VIN≤0.2V, VIN>VCC–0.2V VCC=Max. 0.1 10 µA ∆I CC Quiescent Power Supply Current (TTL inputs HIGH) VIN=VCC–0.6V [11] V CC=Max. 2.0 30 µA Notes: 8. Typical values are at VCC=3.3V, TA = +25˚C ambient. 9. This parameter is specified but not tested. 10. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. 11. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND. |
Nº de peça semelhante - 74FCT163H501CPACT |
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Descrição semelhante - 74FCT163H501CPACT |
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