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ISL54217IRTZ-T Folha de dados(PDF) 7 Page - Intersil Corporation

Nome de Peças ISL54217IRTZ-T
Descrição Electrónicos  USB 2.0 High-Speed x 2Channels/Stereo Audio Dual SP3T (Dual 3-to-1 Multiplexer)
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Fabricante Electrônico  INTERSIL [Intersil Corporation]
Página de início  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

ISL54217IRTZ-T Folha de dados(HTML) 7 Page - Intersil Corporation

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7
FN6817.3
May 4, 2009
Test Circuits and Waveforms
Logic input waveform is inverted for switches that have the opposite
logic sense.
FIGURE 1A. ADDRESS tTRANS MEASUREMENT POINTS
Repeat test for all switches. CL includes fixture and stray
capacitance.
FIGURE 1B. ADDRESS tTRANS TEST CIRCUIT
FIGURE 1. SWITCHING TIMES
FIGURE 2A. MEASUREMENT POINTS
Repeat test for all switches. CL includes fixture and stray
capacitance.
FIGURE 2B. TEST CIRCUIT
FIGURE 2. BREAK-BEFORE-MAKE TIME
FIGURE 3. AUDIO rON TEST CIRCUIT
FIGURE 4. USB rON TEST CIRCUIT
50%
tr < 20ns
tf < 20ns
tOFF
90%
VC0,C1
0V
VINPUT
VC0,C1
tON
LOGIC
INPUT
SWITCH
INPUT
SWITCH
OUTPUT
90%
VOUT
V
OUT
V
(INPUT)
R
L
R
L
r
ON
+
------------------------
=
SWITCH
INPUT
LOGIC
VOUT
RL
CL
COMx
C0,C1
50
Ω
10pF
GND
VDD
C
VINPUT
INPUT
90%
VC0
VC1
tD
LOGIC
INPUT
SWITCH
OUTPUT
0V
VOUT
LOGIC
C0, C1
COMx
RL
CL
VOUT
10pF
50
Ω
1D- OR 1D+
L OR R
VDD
GND
VINPUT
C
INPUT
2D- OR 2D+
VDD
C
COMx
L OR R
GND
VL OR R
V1
rON = V1/60mA
60mA
Repeat test for all switches.
VCOH
C0
C1
VC1H
VDD
C
D- OR D+
COMx
C0
GND
VD- OR D+
V1
rON = V1/40mA
40mA
Repeat test for all switches.
C1
VC0L AND
VC1H OR
VC0H AND
VC1L
ISL54217


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