1

FEATURES

APPLICATIONS

DESCRIPTION/

DRC PACKAGE

(TOP VIEW)

1

10

2

9

3

8

4

7

V

CC

S

D+

D–

OE

1D+

1D–

2D+

2D–

GND

5

6

RSE PACKAGE

(TOP VIEW)

1

10

2

9

3

8

4

7

V

CC

S

D+

D–

OE

1D+

1D–

2D+

2D–

GND

5

6

RSE PACKAGE

(BOTTOM VIEW)

1

10

2

9

3

8

4

7

V

CC

S

D+

D–

OE

1D+

1D–

2D+

2D–

GND

5

6

TS3USB221

HIGH-SPEED USB 2.0 (480-Mbps) 1:2 MULTIPLEXER/DEMULTIPLEXER SWITCH

WITH SINGLE ENABLE

• V

• V

• 1.8-V Compatible Control-Pin Inputs

• Low-Power Mode When OE Is Disabled (1 µA)

• r

• Δr

• C

• Low Power Consumption (30 µA Maximum)

• ESD > 2000-V Human-Body Model (HBM)

• High Bandwidth (1.1 GHz Typical)

• Routes Signals for USB 1.0, 1.1, and 2.0

• Mobile Industry Processor Interface (MIPI)

Signal Routing

ORDERING INFORMATION

The TS3USB221 is a high-bandwidth switch specially

designed for the switching of high-speed USB 2.0

signals in handset and consumer applications, such

as cell phones, digital cameras, and notebooks with

hubs or controllers with limited USB I/Os. The wide

bandwidth (1.1 GHz) of this switch allows signals to

pass with minimum edge and phase distortion. The

device multiplexes differential outputs from a USB

host device to one of two corresponding outputs. The

switch

is

bidirectional

and

offers

little

or

no

attenuation of the high-speed signals at the outputs. It

is

designed

for

low

bit-to-bit

skew

and

high

channel-to-channel noise isolation, and is compatible

with various standards, such as high-speed USB 2.0

(480 Mbps).

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2006–2008, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.