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74VHC02 Folha de dados(PDF) 8 Page - NXP Semiconductors |
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74VHC02 Folha de dados(HTML) 8 Page - NXP Semiconductors |
8 / 14 page 74VHC_VHCT02_1 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 01 — 13 August 2009 8 of 14 NXP Semiconductors 74VHC02; 74VHCT02 Quad 2-input NOR gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Load circuitry for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74VHC02 VCC ≤ 3.0 ns 15 pF, 50 pF tPLH, tPHL 74VHCT02 3.0 V ≤ 3.0 ns 15 pF, 50 pF tPLH, tPHL |
Nº de peça semelhante - 74VHC02 |
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Descrição semelhante - 74VHC02 |
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