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TPS84210RKGR Folha de dados(PDF) 2 Page - Texas Instruments

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Nome de Peças. TPS84210RKGR
descrição  2.95-V to 6-V Input, 2-A Synchronous Buck, Integrated Power Solution
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Fbricantes  TI1 [Texas Instruments]
Página de início  http://www.ti.com
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TPS84210RKGR Folha de dados(HTML) 2 Page - Texas Instruments

 
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TPS84210
SLUSAN7A – SEPTEMBER 2011 – REVISED MARCH 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
ORDERABLE
TRANSPORT
MINIMUM
TA
PACKAGE
PINS
ECO PLAN
NUMBER
MEDIA
QUANTITY
500
Green (RoHS and
-40°C to 85°C
TPS84210RKGR
Tape and Reel
no Sb/Br)
Plastic Quad Flat
39
Pack (BQFN)
250
Green (RoHS and
-40°C to 85°C
TPS84210RKGT
Tape and Reel
no Sb/Br)
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this datasheet, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1) over operating temperature range (unless otherwise noted)
VALUE
UNIT
MIN
MAX
VIN, PWRGD
–0.3
7
V
INH/UVLO, RT/CLK
–0.3
3.3
V
Input Voltage
SS/TR, STSEL, VADJ
–0.3
3
V
SENSE+
VADJ rating must also be met
-0.3
VOUT
V
PH
–0.6
7
V
Output Voltage
PH 10ns Transient
–2
7
V
VOUT
-0.6
VIN
V
VDIFF (GND to exposed thermal pad)
–0.2
0.2
V
RT/CLK, INH/UVLO
±100
µA
Source Current
PH
Current Limit
A
PH
Current Limit
A
Sink Current
SS/TR
±100
µA
PWRGD
10
mA
Operating Junction Temperature
–40
125(2)
°C
Storage Temperature
–65
150
°C
Mechanical Shock
Mil-STD-883D, Method 2002.3, 1 msec, 1/2 sine, mounted
1500
G
Mechanical Vibration
Mil-STD-883D, Method 2007.2, 20-2000Hz
20
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
See the temperature derating curves in the Typical Characteristics section for thermal information.
2
Submit Documentation Feedback
Copyright © 2011–2012, Texas Instruments Incorporated
Product Folder Link(s): TPS84210


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