74ACTQ16240MTD datasheet(5/7 Pages) FAIRCHILD

Nome de Peças	74ACTQ16240MTD

Descrição Electrónicos	16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs

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Fabricante Electrônico	FAIRCHILD [Fairchild Semiconductor]

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FACT Noise Characteristics

The setup of a noise characteristics measurement is critical

to the accuracy and repeatability of the tests. The following

is a brief description of the setup used to measure the

noise characteristics of FACT.

Equipment:

Hewlett Packard Model 8180A Word Generator

PC-163A Test Fixture

Tektronics Model 7854 Oscilloscope

Procedure:

1. Verify Test Fixture Loading: Standard Load 50 pF,

500

Ω.

2. Deskew the HFS generator so that no two channels

have greater than 150 ps skew between them. This

requires that the oscilloscope be deskewed first. It is

important to deskew the HFS generator channels

before testing. This will ensure that the outputs switch

simultaneously.

3. Terminate all inputs and outputs to ensure proper load-

ing of the outputs and that the input levels are at the

correct voltage.

4. Set the HFS generator to toggle all but one output at a

frequency of 1 MHz. Greater frequencies will increase

DUT heating and affect the results of the measure-

ment.

FIGURE 1. Quiet Output Noise Voltage Waveforms

Note 14: VOHV and VOLP are measured with respect to ground refer-

ence.

Note 15: Input pulses have the following characteristics: f

= 1 MHz,

tr = 3 ns, tf = 3 ns, skew < 150 ps.

5. Set the HFS generator input levels at 0V LOW and 3V

HIGH for ACT devices and 0V LOW and 5V HIGH for

AC devices. Verify levels with an oscilloscope.

VOLP/VOLV and VOHP/VOHV:

• Determine the quiet output pin that demonstrates the

greatest noise levels. The worst case pin will usually be

the furthest from the ground pin. Monitor the output volt-

ages using a 50

Ω coaxial cable plugged into a standard

SMB type connector on the test fixture. Do not use an

active FET probe.

• Measure VOLP and VOLV on the quiet output during the

worst case transition for active and enable. Measure

VOHP and VOHV on the quiet output during the worst

case active and enable transition.

• Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

VILD and VIHD:

• Monitor one of the switching outputs using a 50

Ω coaxial

cable plugged into a standard SMB type connector on

the test fixture. Do not use an active FET probe.

• First increase the input LOW voltage level, VIL, until the

output begins to oscillate or steps out a min of 2 ns.

Oscillation is defined as noise on the output LOW level

that exceeds VIL limits, or on output HIGH levels that

exceed VIH limits. The input LOW voltage level at which

oscillation occurs is defined as VILD.

• Next decrease the input HIGH voltage level on the, VIH,

until the output begins to oscillate or steps out a mins of

2 ns. Oscillation is defined as noise on the output LOW

level that exceeds VIL limits, or on output HIGH levels

that exceed VIH limits. The input HIGH voltage level at

which oscillation occurs is defined as VIHD.

• Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

FIGURE 2. Simultaneous Switching Test Circuit

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Descrição semelhante - 74ACTQ16240MTD

Fabricante Electrônico	Nome de Peças	Folha de dados	Descrição Electrónicos
Texas Instruments	74ACT16540	112Kb / 6P	[Old version datasheet] 16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs
Fairchild Semiconductor	74ACT16240	83Kb / 6P	16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs
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Potato Semiconductor Co...	PO74G16240A	1Mb / 5P	16-Bit Inverting Buffer/ Driver with 3-State Outputs
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National Semiconductor ...	54ACTQ16540	72Kb / 5P	16-Bit Inverting Buffer/Line Driver with TRI-STATE Outputs
National Semiconductor ...	54ACTQ16240	75Kb / 6P	16-Bit Inverting Buffer/Line Driver with TRI-STATE Outputs
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