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CAT1162LI42G Folha de dados(PDF) 3 Page - ON Semiconductor |
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CAT1162LI42G Folha de dados(HTML) 3 Page - ON Semiconductor |
3 / 13 page CAT1161, CAT1162 http://onsemi.com 3 SPECIFICATIONS Table 2. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Temperature Under Bias –55 to +125 °C Storage Temperature –65 to +150 °C Voltage on any Pin with Respect to Ground (Note 1) −2.0 to VCC + 2.0 V VCC with Respect to Ground −2.0 to 7.0 V Package Power Dissipation Capability (TA = 25°C) 1.0 W Lead Soldering Temperature (10 sec) 300 °C Output Short Circuit Current (Note 2) 100 mA Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5 V, which may overshoot to VCC +2.0 V for periods of less than 20 ns. 2. Output shorted for no more than one second. No more than one output shorted at a time. Table 3. RELIABILITY CHARACTERISTICS Symbol Parameter Reference Test Method Min Max Units NEND (Note 3) Endurance MIL−STD−883, Test Method 1033 1,000,000 Cycles/Byte TDR (Note 3) Data Retention MIL−STD−883, Test Method 1008 100 Years VZAP (Note 3) ESD Susceptibility MIL−STD−883, Test Method 3015 2000 Volts ILTH (Notes 3 & 4) Latch−Up JEDEC Standard 17 100 mA 3. This parameter is tested initially and after a design or process change that affects the parameter. 4. Latch−up protection is provided for stresses up to 100 mA on address and data pins from –1 V to VCC +1 V. Table 4. D.C. OPERATING CHARACTERISTICS VCC = 2.7 V to 6 V, unless otherwise specified. Symbol Parameter Test Conditions Min Typ Max Units ICC Power Supply Current fSCL = 100 kHz 3 mA ISB Standby Current VCC = 3.3 V 40 mA VCC = 5 V 50 mA ILI Input Leakage Current VIN = GND or VCC 2 mA ILO Output Leakage Current VIN = GND or VCC 10 mA VIL Input Low Voltage −1 VCC x 0.3 V VIH Input High Voltage VCC x 0.7 VCC + 0.5 V VOL1 Output Low Voltage (SDA) IOL = 3 mA, VCC = 3.0 V 0.4 V Table 5. CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5 V Symbol Test Test Conditions Max Units CI/O (Note 3) Input/Output Capacitance (SDA) VI/O = 0 V 8 pF CIN (Note 3) Input Capacitance (SCL) VIN = 0 V 6 pF |
Nº de peça semelhante - CAT1162LI42G |
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Descrição semelhante - CAT1162LI42G |
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