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AD669BQ Folha de dados(PDF) 3 Page - Analog Devices

Nome de Peças AD669BQ
Descrição Electrónicos  Monolithic 16-Bit DACPORT
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Fabricante Electrônico  AD [Analog Devices]
Página de início  http://www.analog.com
Logo AD - Analog Devices

AD669BQ Folha de dados(HTML) 3 Page - Analog Devices

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AD669
REV. A
–3–
TIMING CHARACTERISTICS
VCC = +15 V, VEE = –15 V, VLL = +5 V, VHI = 2.4 V, VLO = 0.4 V
Limit
Limit
Limit
–40 C to
–55 C to
Parameter
+25 C
+85 C
+125 C
Units
(Figure la)
tCS
40
50
55
ns min
tLI
40
50
55
ns min
tDS
30
35
40
ns min
tDH
10
10
15
ns min
tLH
90
110
120
ns min
tLW
40
45
45
ns min
(Figure lb)
tLOW
130
150
165
ns min
tHIGH
40
45
45
ns min
tDS
120
140
150
ns min
tDH
10
10
15
ns min
Specifications subject to change without notice.
Specifications in boldface are tested on all production units at final electrical
test. Results from those tests are used to calculate outgoing quality levels. All
min and max specifications are guaranteed. Those shown in boldface are tested
on all production units.
AC PERFORMANCE CHARACTERISTICS
Parameter
Limit
Units
Test Conditions/Comments
Output Settling Time
13
µs max
20 V Step, TA = +25
°C
(Time to
±0.0008% FS
8
µs typ
20 V Step, TA = +25°C
with 2 k
Ω, 1000 pF Load)
10
µs typ
20 V Step, TMIN
≤ T
A
≤ T
MAX
6
µs typ
10 V Step, TA = +25
°C
8
µs typ
10 V Step, TMIN ≤ TA ≤ TMAX
2.5
µs typ
1 LSB Step, TMIN
≤ T
A
≤ T
MAX
Total Harmonic Distortion + Noise
A, B, S Grade
0.009
% max
0 dB, 1001 Hz; Sample Rate = 100 kHz; TA = +25
°C
A, B, S Grade
0.07
% max
–20 dB, 1001 Hz; Sample Rate = 100 kHz; TA = +25
°C
A, B, S Grade
7.0
% max
–60 dB, 1001 Hz; Sample Rate = 100 kHz; TA = +25°C
Signal-to-Noise Ratio
83
dB min
TA = +25°C
Digital-to-Analog Glitch Impulse
15
nV-s typ
DAC Alternately Loaded with 8000H and 7FFFH
Digital Feedthrough
2
nV-s typ
DAC Alternately Loaded with 0000H and FFFFH; CS High
Output Noise Voltage
120
nV/
√Hz typ
Measured at VOUT, 20 V Span; Excludes Reference
Density (1 kHz – 1 MHz)
Reference Noise
125
nV/
√Hz typ
Measured at REF OUT
Specifications subject to change without notice.
Specifications in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and
max specifications are guaranteed. Those shown in boldface are tested on all production units.
(With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested.
TMIN
≤ T
A
≤ T
MAX, VCC = +15 V, VEE = –15 V, VLL = +5 V except where noted.)
DATA
LDAC
tDS
tDH
CS
tLW
t LH
L1
t
CS
t
L1
Figure 1a. AD669 Level Triggered Timing Diagram
DATA
t DS
tDH
CS AND/OR
L1, LDAC
TIE
CS AND/OR L1 TO GROUND OR TOGETHER WITH LDAC
t LOW
tHIGH
Figure 1b. AD669 Edge Triggered Timing Diagram


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