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AD677TD883B Folha de dados(PDF) 10 Page - List of Unclassifed Manufacturers |
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AD677TD883B Folha de dados(HTML) 10 Page - List of Unclassifed Manufacturers |
10 / 12 page STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95592 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. TABLE II. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Subgroups (in accordance with MIL-PRF-38535, table III) Device class M Device class Q Device class V Interim electrical parameters (see 4.2) 1 1 1 Final electrical parameters (see 4.2) 1, 2, 3, 4, 5, 6, 9, 10, 11 1/ 1, 2, 3, 4, 5, 6, 9, 10, 11 1/ 1, 2, 3, 4, 5, 6, 9, 10, 11 1/ Group A test requirements (see 4.4) 1, 2, 3, 4, 5, 6, 9, 10, 11 1, 2, 3, 4, 5, 6, 9, 10, 11 1, 2, 3, 4, 5, 6, 9, 10, 11 Group C end-point electrical parameters (see 4.4) 1 1 1, 2, 3, 4, 5, 6, 9, 10, 11 Group D end-point electrical parameters (see 4.4) 1 1 1, 4, 9 Group E end-point electrical parameters (see 4.4) 1 1 1, 4, 9 1/ PDA applies to subgroup 1. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL- STD-883. |
Nº de peça semelhante - AD677TD883B |
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Descrição semelhante - AD677TD883B |
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