STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-93083

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

A

SHEET

3

DSCC FORM 2234

APR 97

1.3 Absolute maximum ratings. 1/

Differential input voltage ...............................................................................................

30 V dc

Output short circuit duration .......................................................................................... Continuous

Storage temperature range ........................................................................................... -65

C to +150C

Lead temperature (soldering, 60 seconds) .................................................................... +300

C

Thermal resistance, junction-to-case (

Thermal resistance, junction-to-ambient (

1.4 Recommended operating conditions.

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883

-

Test Method Standard Microcircuits.

MIL-STD-1835 -

Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 -

List of Standard Microcircuit Drawings.

MIL-HDBK-780 -

Standard Microcircuit Drawings.

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

______

1/

Permanent damage may occur if any one absolute maximum rating is exceeded. Functional operational is not implied,

and device reliability may be impaired by exposure to high than recommended voltages for extended periods of time.