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CD40175BMS Folha de dados(PDF) 6 Page - Intersil Corporation |
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CD40175BMS Folha de dados(HTML) 6 Page - Intersil Corporation |
6 / 8 page 7-1397 Specifications CD40175BMS TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS FUNCTION OPEN GROUND VDD 9V ± -0.5V OSCILLATOR 50kHz 25kHz Static Burn-In 1 (Note 1) 2, 3, 6, 7, 10, 11, 14, 15 1, 4, 5, 8, 9, 12, 13 16 Static Burn-In 2 (Note 1) 2, 3, 6, 7, 10, 11, 14, 15 8 1, 4, 5, 9, 12, 13, 16 Dynamic Burn- In (Note 1) - 8 1, 16 2, 3, 6, 7, 10, 11, 14, 15 9 4, 5, 12, 13 Irradiation (Note 2) 2, 3, 6, 7, 10, 11, 14, 15 8 1, 4, 5, 9, 12, 13, 16 NOTES: 1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V 2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ± 0.5V Logic Diagram FIGURE 1. 1 OF 4 FLIP-FLOPS TRUTH TABLE FOR 1 OF 4 FLIP-FLOPS (Positive Logic) INPUTS OUTPUTS CLOCK DATA CLEAR Q Q 0101 1110 X1 Q Q X X 001 1 = High level X = Don’t care 0 = Low level CL CL CLR * 1 CLK * 9 CL CL CL CL p n p n CL CL * ALL INPUTS ARE PROTECTED BY CMOS PROTECTION NETWORK VDD VSS CL CL p n D * Q Q p n |
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Descrição semelhante - CD40175BMS |
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