4-6

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1 Note 1

11 - 15

1 - 10

16

Static Burn-In 2 Note 1

11 - 15

8

1 - 7, 9, 10, 16

Dynamic Burn-In Note 1

-

8

1, 7, 9, 10, 16

11 - 15

2 - 6

-

Irradiation Note 2

11 - 15

8

1 - 7, 9, 10, 16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

± 0.5V

Logic Diagrams

FIGURE 1. LOGIC DIAGRAM FOR CD40160BMS AND CD40162BMS BCD DECADE COUNTERS

LD PI

T

CL

CLR

LD PI

T

CL

CLR

LD PI

T

CL

CLR

LD PI

T

CL

CLR

14

13

12

11

15

6

16

5

4

3

10

7

9

2

1

9

2

1

CD40160BMS

ASYNCHRONOUS

CLEAR

CLOCK

*

CLEAR

*

CD40162BMS

SYNCHRONOUS

CLEAR

CMOS PROTECTION NETWORK

LOAD

*

LOAD

*

CLOCK

*

CLEAR

*

PE

TE

P1

P2

P3

VDD

P4

**

*

*

*

*

*

Q4

Q1

Q4

Q1

Q1

Q1

Q2

Q3

Q4

Q1

Q2

Q3

Q4

Q1

Q2

Q3

Q4

COUT

CD40160BMS AND CD40162BMS BCD DECADE COUNTERS

Q1

VDD

VSS

CD40160BMS, CD40161BMS, CD40162BMS, CD40163BMS